X-Cite Optical Power Measurement System
The X-Cite® Optical Power Measurement System is designed for measuring optical power in watts at the specimen level that enables consistent and repeatable illumination throughout research experiments, and also assist in equipment set-up and troubleshooting. The system includes the X-Cite XP750 sensor which has a low, sleek profile that fits on the microscope stage and offers the versatility of measuring power output from an X-Cite microscope illuminator or any other epi-fluorescence light source. By fitting a wide dynamic range into a compact sensor, we have made it easier than ever to obtain this critical information.

Broad Dynamic Range
Calibrated for use at any wavelength between 320 nm and 750 nm, X-Cite XP750 is compatible with a full range of filters. With sensitivity to power levels from 5 µW to 500 mW, it is appropriate for applications using both low and high intensity illumination. This makes it suitable for use on standard, confocal, DSU and other microscope configurations.

Versatile and Convenient
X-Cite XP750 measures light right on the microscope stage so it can be used with any epi-fluorescence light source including: HBO / mercury, metal halide or xenon lamps, lasers and LEDs. With hundreds of wavelength choices, X-Cite XR2100 allows you to define ‘favorite wavelengths’ to correspond to your most frequently used sources and filters.

Repeatable Results
By measuring and recording power output in absolute units (watts) with X-Cite, illumination levels used in an experiment can always be repeated, no matter how light sources, light guides, filters and other optical components change over time. This unique capability is critical for reducing post-experiment image processing time; making accurate, quantitative image comparisons; and compiling complete, experiment documentation.

TECHNICAL SPECIFICATIONS:
X-Cite XP750
Includes:Objective plane power sensor with cable / connector for X-Cite XR2100
Power Range:5 µW-500 mW
Measurement Resolution:0.01 µW-1 mW
Uncertainty***:±6%
Response Time:600 ms (initial), 3 s (to ensure stable reading)
Calibration:Traceable to NRC**
Wavelength Range:320 nm-750 nm
Lamp Type / Light Source Compatibility:X-Cite 200DC, X-Cite exacte, X-Cite 120 Series, Mercury / HBO, Metal Halide, Xenon, LED, Laser
Objective Compatibility:4X-63X; air coupled, with FOV diameters less than 10mm
Display:Via X-Cite XR2100
Wavelength Selection:1nm increments using up / down buttons on X-Cite XR2100 or PC interface
Data Capacity:Via X-Cite XR2100
PC Controls:View / change settings, define favorite wavelengths, record data for multiple objectives / filters / intensity settings, download / export stored data
Command Protocol:Via X-Cite XR2100
Power Supply:Via X-Cite XR2100
Weight:2.9 oz (82 g)
Dimensions (without cover):3" x 1" x 0.35" (75 mm x 2 5mm x 9 mm)
Worldwide Certifications:Via X-Cite XR2100
Warranty:1 year
Patents:X-Cite Optical Power Measurement System incorporates technology protected by the following patents: US#6,437,861; US#7,335,901

*NIST-National Institute of Standards and Technology
**NRC-National Research Council
***Calibration of X-Cite XR2100 and X-Cite XP750 is recommended every twelve months. Contact us for further information.